2026-05-08
Every ADC needs a stable input voltage during conversion. If the signal moves while the ADC is busy comparing bits, you get garbage. The sample-and-hold (S/H) circuit solves this by capturing a voltage at a precise instant and holding it steady until the next sample.
The textbook topology is dead simple: an analog switch (MOSFET or CMOS gate) feeds a hold capacitor, which is buffered by a high-impedance op-amp. When the switch closes, CH charges to Vin. When it opens, the cap holds the voltage while the buffer presents it to the ADC.
Choosing the hold capacitor is the central trade-off:
Quick calculation — droop rate: If your buffer has 10 pA input bias current and your switch leaks 50 pA, total leakage is 60 pA. With CH = 1 nF:
dV/dt = I/C = 60 pA / 1 nF = 60 µV/ms
For a 12-bit ADC on a 5 V range, 1 LSB = 1.22 mV. You'd drift one LSB in roughly 20 ms — fine for slow conversions, terrible for anything fast.
Acquisition time is set by Ron·CH. For 12-bit accuracy you need ~9 time constants (since e⁻⁹ ≈ 0.012%). With Ron = 100 Ω and CH = 1 nF, that's 900 ns minimum — reality dictates you also include the source impedance.
Real-world example: A digital storage scope front-end uses a fast S/H (often a Schottky diode bridge or GaAs FET switch) ahead of a flash ADC. CH might be just 5–10 pF to get sub-nanosecond acquisition, accepting heavy droop because the ADC fires within a few nanoseconds.
Most modern SAR and pipeline ADCs have an integrated S/H on the input — but you still need to know what's happening, because the ADC datasheet specifies maximum source impedance precisely so the internal cap can charge fast enough. Drive a 12-bit SAR from a 10 kΩ source and you'll get nonsense codes. Add a unity-gain buffer (low output impedance, fast settling) and the problem disappears.
Use a C0G/NP0 ceramic or film capacitor for CH — never X7R. Dielectric absorption in lesser ceramics causes "memory effect" where the cap slowly recovers a previous voltage, ruining accuracy.
